WE UTILIZE THE LATEST TECHNOLOGY AND TECHNIQUES TO ASSURE HIGHEST QUALITY MACHININGS

• IATF 16949 Certified
• New JEOL scanning electron microscope and Oxford EDS microanalysis system
• This system allows Mueller to examine material at magnifications up 20,000X with remarkable depth of field.
• The microanalysis equipment allows semi-quantitative elemental analysis on areas as large as square centimeters in size, down to points measured in microns.
• Spectroscopy analysis used to verify chemical limits of specific brass and aluminum alloys.
• Zeiss Contura G2 CMM
• Digital Hardness Testers