WE UTILIZE THE LATEST TECHNOLOGY AND TECHNIQUES TO ASSURE HIGHEST QUALITY MACHININGS
- IATF 16949 Certified
- New JEOL scanning electron microscope and Oxford EDS microanalysis system
- This system allows Mueller to examine material at magnifications up 20,000X with remarkable depth of field.
- The microanalysis equipment allows semi-quantitative elemental analysis on areas as large as square centimeters in size, down to points measured in microns.
- Spectroscopy analysis used to verify chemical limits of specific brass and aluminum alloys.
- Zeiss Contura G2 CMM
- Digital Hardness Testers